Test Result Spotlight
Potential induced degradation can take many forms, including PID-s (shunting), PID-c (corrosion), and PID-p (polarization). Recent PQP testing has revealed an increasing number of BOMs that are susceptible to PID-p, including the TOPCon module shown here. Kiwa PVEL’s testing has confirmed that many BOMs do not exhibit PID-p, but others can suffer a significant amount of power loss. While a subsequent short duration exposure to UV light can often reverse this effect, some research has shown examples of PID-p occurring in the field.