Incidence Angle Modifier

Incidence Angle Modifier

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Incidence Angle Modifier (IAM) coefficients evaluate the response of a PV module to light coming from various angles. IEC 61853-2:2016 defines an indoor test method for characterization of the IAM values of a PV device with respect to the angle of incidence (AOI) by measuring short-circuit current (Isc). Kiwa PVEL has improved upon this test method to capture IAM profiles for both glass//backsheet and glass//glass modules. This unique indoor IAM testing method has demonstrated world-leading results for precision and repeatability.

Key
Takeaways

World class measurement accuracy shows minimal variation in IAM performance.

Kiwa PVEL’s measured IAM results using our best-in-class test method show that the IAM values on commercial modules are highly homogenous. This is counter to what has been reported by some other test labs and module manufacturers. See the Measured IAM Fleet graph below for more. See the Measured IAM Fleet graph below for more.

Test Result Spotlight

The consistency across Kiwa PVEL’s IAM measurements may surprise some in the industry who are used to seeing more aggressive IAM values. But despite the relative closeness in IAM measurements, the differences between BOMs can still be significant for project energy and financial models. The zoomed-in IAM graph below compares the lowest and highest performing BOMs that Kiwa PVEL has measured since launching our upgraded IAM test in 2023. Compared to energy models using the PVsyst Fresnel ARC default, the worst performer results in 0.24% lower energy yield and the best performer results in 0.28% higher energy yield when modeled using PVsyst on a single-axis tracking system in Las Vegas, NV.

Test Result Spotlight

Power Degradation of BDS BOMs

Power degradation chart for BDS stress sequence

Kiwa PVEL's IAM test results across 38 BOMs showing strong consistency. PVsyst's Fresnel ARC default included for reference.

A case study on why PAN (and IAM) is important, what PV module materials are assessed, and the test procedure for PAN and IAM can be found here on kiwa.com/pvel

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