98% of BOMs tested had less than 2% power loss.
Multi-busbar (9BB or greater) results in less opportunity for inactive areas to form across cracked cells, leading to the lowest average and median MSS degradation rates in PVEL’s history.
No additional cracked cells seen in glass//glass modules.
With cells in the neutral plane, no glass//glass module experienced cell-level damage following MSS, resulting in lower average and median power loss than glass//backsheet modules.
MSS tracker-mounting reveals more issues.
While PVEL reports the best ever MSS results when modules were mounted using traditional two-rail mounting, mixed results were seen in tracker-mounted MSS, with multiple modules breaking during 1800 Pa SML or subsequent DML.
7% of BOMs tested experienced an MSS-related failure.
During SML testing the glass in glass//glass modules was over twice as likely to break than for glass//backsheet modules. Additionally, in one glass//glass BOM the TC50 + HF10 portion of the test led to delamination along the module edge.